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Agenda

EMC

ElectroMagnetic Compatibility

  

Objective: This new category will be offered two times within 2008 to be combined with two 78K0 and two V850 device workshops. This session will highlight the background of EMC, measurements methods and will give LSI and design measures to improve EMC with NEC microcontrollers.


Schedule:

Introduction

  • Why EMC ?
  • Terms
  • Background
  • Signal classification
  • Thumb rules

LSI measures to improve EMC

  • Example layout of NEC microcontroller
  • Optimized oscillator
  • Separated power consumption
  • Optimized I/O buffer
  • EMC guideline improvement

 

  


Design measures to improve EMC

  • Ground system
  • Classification of supply pins
  • Supply system and decoupling
  • Handling of critical signals
  • Software and configuration measures
  • Handling of unused pins
  • Oscillator design hints

Customer Support on EMC

Measurement methods

  • Equipment level measurement methods
  • Device level measurement methods

Wrap up and discussion

Download Agenda as PDF
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